Struct edlang_ast::StructField
source · pub struct StructField {
pub name: Ident,
pub type: Type,
pub span: Span,
}
Fields§
§name: Ident
§type: Type
§span: Span
Trait Implementations§
source§impl Clone for StructField
impl Clone for StructField
source§fn clone(&self) -> StructField
fn clone(&self) -> StructField
Returns a copy of the value. Read more
1.0.0 · source§fn clone_from(&mut self, source: &Self)
fn clone_from(&mut self, source: &Self)
Performs copy-assignment from
source
. Read moresource§impl Debug for StructField
impl Debug for StructField
source§impl Hash for StructField
impl Hash for StructField
source§impl Ord for StructField
impl Ord for StructField
source§fn cmp(&self, other: &StructField) -> Ordering
fn cmp(&self, other: &StructField) -> Ordering
1.21.0 · source§fn max(self, other: Self) -> Selfwhere
Self: Sized,
fn max(self, other: Self) -> Selfwhere
Self: Sized,
Compares and returns the maximum of two values. Read more
source§impl PartialEq for StructField
impl PartialEq for StructField
source§fn eq(&self, other: &StructField) -> bool
fn eq(&self, other: &StructField) -> bool
This method tests for
self
and other
values to be equal, and is used
by ==
.source§impl PartialOrd for StructField
impl PartialOrd for StructField
source§fn partial_cmp(&self, other: &StructField) -> Option<Ordering>
fn partial_cmp(&self, other: &StructField) -> Option<Ordering>
1.0.0 · source§fn le(&self, other: &Rhs) -> bool
fn le(&self, other: &Rhs) -> bool
This method tests less than or equal to (for
self
and other
) and is used by the <=
operator. Read moreimpl Eq for StructField
impl StructuralPartialEq for StructField
Auto Trait Implementations§
impl RefUnwindSafe for StructField
impl Send for StructField
impl Sync for StructField
impl Unpin for StructField
impl UnwindSafe for StructField
Blanket Implementations§
source§impl<T> BorrowMut<T> for Twhere
T: ?Sized,
impl<T> BorrowMut<T> for Twhere
T: ?Sized,
source§fn borrow_mut(&mut self) -> &mut T
fn borrow_mut(&mut self) -> &mut T
Mutably borrows from an owned value. Read more